Actualité : Functional test of processor-based systems: state-of-the-art and current trends
Jeudi 26 juin au LIRMM
Functional test of processor-based systems: state-of-the-art and current trends
Dr. Matteo SONZA REORDA
Politecnico di Torino
10:30 am Salle de Séminaire, LIRMM
161, rue Ada - 34090 Montpellier
Summary: Test of processor-based systems is a major challenge due to the growing usage of electronic systems even in safety-critical applications and to the higher chances of failures in new devices. While Design for Testability is definitely an effective solution, there are situations in which alternative or complementary ways have to be explored (e.g., because DfT solutions are not usable and/or documented, or because the defect coverage is not sufficient), and functional testing may represent an effective solution. The presentation will overview the state of the art and the main open issues in this area (e.g., in terms of achievable defect coverage, test time, and costs), emphasizing the limitations of the functional approach, but also reporting about recent advancements that could allow its easier and wider adoption in practice.
About the speaker: Matteo took his PhD degree in Computer Engineering at the Politecnico di Torino in 1990. Since 1990 he is with the Dipartimento di Automatica e Informatica of the Politecnico di Torino, where he currently is a Full Professor. He is the leader of the CAD Group working within the Dipartimento di Automatica e Informatica of the Politecnico di Torino. He is the author of several papers in the area of test & reliability of digital circuits. He received several awards for his research work. He has been the General Co-chair (1998) and Program Co-chair (2002 and 2003) of the IEEE International On-Line Testing Symposium (IOLTS). He has been the Program Chair of the 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits & Systems and the General Chair of the 13th IEEE European Test Symposium 2008 (ETS). He has also been the Program Co-Chair of the 14thIEEE Latin-American Test Workshop (LATW2013). He serves as a member in the Program Committee of several events, including ETS, DATE, IOLTS, VTS, LATW, SBCCI, DDECS, VLSI-SOC,IDT. He is the scientific responsible for several National and International research projects funded either by industries of by public bodies.